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  1. Engineering Metrology Toolbox

    The Engineering Metrology Group promotes health and growth of U.S. discrete-parts manufacturing by: providing access to world-class engineering resources; ...
    calibration2
    metrology2
    interferometry1
    dimensional metrology1
    index of refraction1
    Engineering Metrology1
    air refractive index0
    Ciddor equation0
    Edlen equation0
    elastic compression0

    emtoolbox.nist.gov - 2009-04-07

  2. Thin Film Home Page - HORIBA

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometer.info - 2009-04-04

  3. Thin Film Home Page

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometry.co.uk - 2009-02-08

  4. Process Control Products from HORIBA Jobin Yvon

    Process Applications of Thin Film
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.jyprocesscontrol.com - 2009-02-07

  5. High End Research Ellipsometer

    UVISEL Ellipsometers
    Delta2
    instrumentation2
    Psi2
    real time2
    metrology2
    rotating1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    ex-situ1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    polarised light1
    phase modulation1
    characterisation of thin film0
    ellipsometric angles0
    fresnel reflection0
    in-situ uvisel ellipsometer0
    real time process monitoring0
    uvisel0

    www.uvisel.com - 2009-02-14

  6. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  7. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

  8. PlasmaScope from HORIBA Jobin Yvon

    PlasmaScope, portable multichannel optical emission spectrometer with advanced end point
    portable3
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    oes1
    multichannel1
    endpoint1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    multiwavelength ellipsometer1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    end point detection1
    optical emission spectrometer0
    plasma chemical composition0
    plasma diagnosis0
    plasmascope0
    reactive species0

    www.plasmascope.com - 2009-02-06

  9. Mineralogy Database

    Complete, up-to-date, mineral database containing 4,442 mineral species descriptions and comprehensive picture library of images. These data are linked to ...
    environment4
    database4
    data3
    color3
    minerals2
    mineral2
    density1
    hardness1
    name origins1
    cleavage1
    mineralogy1
    luster1
    crystallography1
    streak1
    luminescence1
    locality1
    physical properties1
    optical properties1
    tenacity1
    chemical properties1
    alphabetical list1
    index of refraction1
    mineralogy database1
    crystal systems1
    webmineral1
    diaphaniety1
    webminerals1
    axial ratios1
    comprehensive picture1
    dana classification1
    mineral images1

    webmineral.com - 2009-03-07

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